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Single-event induced charge collection in Ge-channel pMos FinFETs

dc.contributor.authorRony, M.W.
dc.contributor.authorSamsel, Isaak
dc.contributor.authorZhang, En Xia
dc.contributor.authorSternberg, Andrew
dc.contributor.authorLi, Kan
dc.contributor.authorReaz, Mahumed
dc.contributor.authorAustin, Stephanie
dc.contributor.authorReed, Robert
dc.contributor.authorFleetwood, Robert
dc.contributor.authorAlles, Mike
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMitard, Jerome
dc.contributor.authorSchrimpf, Ronald
dc.date.accessioned2021-10-29T03:15:03Z
dc.date.available2021-10-29T03:15:03Z
dc.date.issued2020-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35854
dc.sourceIIOimport
dc.titleSingle-event induced charge collection in Ge-channel pMos FinFETs
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageE-1
dc.source.conferenceNuclear & Space Radiation Effects Conference - NSREC
dc.source.conferencedate1/12/2020
dc.source.conferencelocationVirtual USA
dc.identifier.urlhttp://www.nsrec.com/2020_session-e.html
imec.availabilityPublished - open access


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