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μSBS: Static binary sanitization of bare-metal embedded devices for fault observability
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μSBS: Static binary sanitization of bare-metal embedded devices for fault observability
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Date
2020-10
Proceedings Paper
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48149.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Salehi, Majid
;
Hughes, Danny
;
Crispo, Bruno
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Abstract
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1900
since deposited on 2021-10-29
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Acq. date: 2025-12-12
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Metrics
Views
1900
since deposited on 2021-10-29
2
last month
Acq. date: 2025-12-12
Citations