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Investigation of semi-vertical GaN FET structures function using EBIC method

dc.contributor.authorSatka, Alexander
dc.contributor.authorPriesol, Juraj
dc.contributor.authorYou, Shuzhen
dc.contributor.authorGeens, Karen
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-29T03:43:59Z
dc.date.available2021-10-29T03:43:59Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35904
dc.sourceIIOimport
dc.titleInvestigation of semi-vertical GaN FET structures function using EBIC method
dc.typeProceedings paper
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorGeens, Karen
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecGeens, Karen::0000-0003-1815-3972
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage92
dc.source.endpage93
dc.source.conferenceThe 11th Solid State Surfaces and Interfaces (SSSI 2020)
dc.source.conferencedate23/11/2020
dc.source.conferencelocationSmolenice Castle Slovakia
imec.availabilityPublished - imec


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