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Deep-level transient spectroscopy of GaAs nanoridge diodes grown on Si substrates

dc.contributor.authorSyshchyk, Olga
dc.contributor.authorHsu, Brent
dc.contributor.authorYu, Hao
dc.contributor.authorMotsnyi, Vasyl
dc.contributor.authorVais, Abhitosh
dc.contributor.authorKunert, Bernardette
dc.contributor.authorMols, Yves
dc.contributor.authorAlcotte, Reynald
dc.contributor.authorPuybaret, Renaud
dc.contributor.authorWaldron, Niamh
dc.contributor.authorSoussan, Philippe
dc.contributor.authorBoulenc, Pierre
dc.contributor.authorKarve, Gauri
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCollaert, Nadine
dc.contributor.authorPuers, Bob
dc.contributor.authorVan Hoof, Chris
dc.date.accessioned2021-10-29T05:02:23Z
dc.date.available2021-10-29T05:02:23Z
dc.date.issued2020
dc.identifier.issn2331-7019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36036
dc.sourceIIOimport
dc.titleDeep-level transient spectroscopy of GaAs nanoridge diodes grown on Si substrates
dc.typeJournal article
dc.contributor.imecauthorSyshchyk, Olga
dc.contributor.imecauthorHsu, Brent
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorMotsnyi, Vasyl
dc.contributor.imecauthorVais, Abhitosh
dc.contributor.imecauthorKunert, Bernardette
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorAlcotte, Reynald
dc.contributor.imecauthorPuybaret, Renaud
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorSoussan, Philippe
dc.contributor.imecauthorBoulenc, Pierre
dc.contributor.imecauthorKarve, Gauri
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorPuers, Bob
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.orcidimecHsu, Brent::0000-0003-0823-6088
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecMotsnyi, Vasyl::0000-0001-5297-9298
dc.contributor.orcidimecVais, Abhitosh::0000-0002-0317-7720
dc.contributor.orcidimecKunert, Bernardette::0000-0002-8986-4109
dc.contributor.orcidimecSoussan, Philippe::0000-0002-1347-6978
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecVan Hoof, Chris::1234-1234-1234-1234
dc.source.peerreviewyes
dc.source.beginpage24093
dc.source.journalPhysical Review Applied
dc.source.issue2
dc.source.volume14
dc.identifier.urlhttps://doi.org/10.1103/PhysRevApplied.14.024093
imec.availabilityPublished - imec


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