dc.contributor.author | Lanckmans, Filip | |
dc.contributor.author | Geenen, Luc | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-06T11:40:44Z | |
dc.date.available | 2021-10-06T11:40:44Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3607 | |
dc.source | IIOimport | |
dc.title | A modified capacitance/voltage technique to characterize copper drift diffusion in organic low-K dielectrics | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Maex, Karen | |
dc.source.peerreview | no | |
dc.source.conference | Advanced Metallization Conference; September 28-30, 1999; Orlando, FL, USA. | |
imec.availability | Published - imec | |