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Automating the early detection of security design flaws

dc.contributor.authorTuma, Katja
dc.contributor.authorSion, Laurens
dc.contributor.authorScandariato, Riccardio
dc.contributor.authorYskout, Koen
dc.date.accessioned2021-10-29T05:37:06Z
dc.date.available2021-10-29T05:37:06Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36093
dc.sourceIIOimport
dc.titleAutomating the early detection of security design flaws
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage332
dc.source.endpage342
dc.source.conferenceMODELS '20: Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems
dc.source.conferencedate13/10/2020
dc.source.conferencelocationMontreal Canada
dc.identifier.urlhttps://doi.org/10.1145/3365438.3410954
imec.availabilityPublished - open access


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