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Reliability by design approach for life time prediction of electronic systems,

dc.contributor.authorVandevelde, Bart
dc.date.accessioned2021-10-29T06:41:17Z
dc.date.available2021-10-29T06:41:17Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36198
dc.sourceIIOimport
dc.titleReliability by design approach for life time prediction of electronic systems,
dc.typeOral presentation
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.orcidimecVandevelde, Bart::0000-0002-6753-6438
dc.source.peerreviewno
dc.source.conferencecEDM workshop
dc.source.conferencedate10/01/2020
dc.source.conferencelocationleuven Belgium
imec.availabilityPublished - imec


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