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Exposure to RF-EMF hotspots induced by maximum ratio field combining in 5th generation networks

dc.contributor.authorVelghe, Maarten
dc.contributor.authorShikhantsov, Sergei
dc.contributor.authorTanghe, Emmeric
dc.contributor.authorMartens, Luc
dc.contributor.authorJoseph, Wout
dc.contributor.authorThielens, Arno
dc.date.accessioned2021-10-29T07:01:24Z
dc.date.available2021-10-29T07:01:24Z
dc.date.issued2020-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36229
dc.sourceIIOimport
dc.titleExposure to RF-EMF hotspots induced by maximum ratio field combining in 5th generation networks
dc.typeProceedings paper
dc.contributor.imecauthorVelghe, Maarten
dc.contributor.imecauthorShikhantsov, Sergei
dc.contributor.imecauthorTanghe, Emmeric
dc.contributor.imecauthorMartens, Luc
dc.contributor.imecauthorJoseph, Wout
dc.contributor.imecauthorThielens, Arno
dc.contributor.orcidimecVelghe, Maarten::0000-0002-3146-7004
dc.contributor.orcidimecTanghe, Emmeric::0000-0003-0020-6466
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.contributor.orcidimecJoseph, Wout::0000-0002-8807-0673
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage380
dc.source.endpage384
dc.source.conferenceJoint Annual Meeting of the Bioelectromagnetics Society and the European BioElectromagnetics Association (BioEM 2020)
dc.source.conferencedate21/06/2020
dc.source.conferencelocationOxford United Kingdom
imec.availabilityPublished - open access
imec.internalnotesThis conference was cancelled due to COVID-19, but all accepted papers intended to be presented at BioEM 2020 were published.


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