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RF/high-speed I/O ESD protection: Co-optimizing strategy between BEOL capacitance and HBM immunity in advanced CMOS process
Publication:
RF/high-speed I/O ESD protection: Co-optimizing strategy between BEOL capacitance and HBM immunity in advanced CMOS process
Date
2020
Journal article
https://doi.org/10.1109/TED.2020.2994492
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45654.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Wei-Min
;
Ker, Ming-Dou
;
Chen, Shih-Hung
;
Chen, Jie-Ting
;
Linten, Dimitri
;
Groeseneken, Guido
Journal
IEEE Transactions on Electron Devices
Abstract
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1983
since deposited on 2021-10-29
Acq. date: 2025-10-25
Citations
Metrics
Views
1983
since deposited on 2021-10-29
Acq. date: 2025-10-25
Citations