Authors

Wu, Wei-Min; Ker, Ming-Dou; Chen, Shih-Hung; Chen, Jie-Ting; Linten, Dimitri; Groeseneken, Guido

DOI

10.1109/TED.2020.2994492

ISSN

0018-9383

Issue

7

Journal

IEEE Transactions on Electron Devices

Volume

67

Title

RF/high-speed I/O ESD protection: Co-optimizing strategy between BEOL capacitance and HBM immunity in advanced CMOS process

Publication type

Journal article

Embargo date

9999-12-31