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Effect of surface electric field on Coulomb blockade energy and RTS capture kinetics in submicron nMOSFETs

dc.contributor.authorLukyanchikova, N. B.
dc.contributor.authorPetrichuk, M. V.
dc.contributor.authorGarbar, N. P.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-14T11:29:47Z
dc.date.available2021-10-14T11:29:47Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3636
dc.sourceIIOimport
dc.titleEffect of surface electric field on Coulomb blockade energy and RTS capture kinetics in submicron nMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage344
dc.source.endpage347
dc.source.conferenceICNF - 15th International Conference on Noise in Physical Systems and 1/f Fluctuations
dc.source.conferencedate23/08/1999
dc.source.conferencelocationHong-Kong
imec.availabilityPublished - open access


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