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An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method

dc.contributor.authorZhou, L.
dc.contributor.authorBo, T.
dc.contributor.authorJi, Z.
dc.contributor.authorYang, H.
dc.contributor.authorXu, H.
dc.contributor.authorLiu, Q.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorWang, X.
dc.contributor.authorMa, X.
dc.contributor.authorLi, Y.
dc.contributor.authorYin, H.
dc.contributor.authorDu, A.
dc.contributor.authorZhao, C.
dc.contributor.authorWang, W.
dc.date.accessioned2021-10-29T09:04:19Z
dc.date.available2021-10-29T09:04:19Z
dc.date.issued2020
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36414
dc.sourceIIOimport
dc.titleAn investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage92
dc.source.endpage96
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.issue1
dc.source.volume20
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8952660
imec.availabilityPublished - imec


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