dc.contributor.author | Le, Quoc Toan | |
dc.contributor.author | Kesters, Els | |
dc.contributor.author | Doms, Mathias | |
dc.contributor.author | Altamirano Sanchez, Efrain | |
dc.date.accessioned | 2021-10-31T09:23:37Z | |
dc.date.available | 2021-10-31T09:23:37Z | |
dc.date.issued | 2021 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36886 | |
dc.source | IIOimport | |
dc.title | Effect of surface chemistry on Ruthenium wet etching | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Le, Quoc Toan | |
dc.contributor.imecauthor | Kesters, Els | |
dc.contributor.imecauthor | Altamirano Sanchez, Efrain | |
dc.contributor.orcidimec | Le, Quoc Toan::0000-0002-0206-6279 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 303 | |
dc.source.endpage | 306 | |
dc.source.conference | Ultra Clean Processing of Semiconductor Surfaces (UCPSS) | |
dc.source.conferencedate | 12/04/2021 | |
dc.source.conferencelocation | Leuven Belgium | |
dc.identifier.url | https://doi.org/10.4028/www.scientific.net/SSP.314.302 | |
imec.availability | Published - imec | |
imec.internalnotes | Solid State Phenomena; Vol. 314 | |