Authors

Marinissen, Erik Jan; Stucchi, Michele; Vardaman, E. Jan; Armstrong, Dave; Chen, Harry; Goel, Sandeep Kumar; Huang, Yu; McLaurin, Teresa

Conference

2021 IEEE European Test Symposium (ETS)

Title

Design and Manufacturing Technology of Advanced Multi-Die Packages on the 'Slope of Enlightenment': Where Is 3D-Test?

Publication type

Proceedings paper