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Assessment of N-type and P-type doping in (Al,Ga)N heterostructures by Scanning probe microscopy techniques
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Assessment of N-type and P-type doping in (Al,Ga)N heterostructures by Scanning probe microscopy techniques
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Date
2021
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Minj, Albert
;
Zhao, Ming
;
Bakeroot, Benoit
;
Paredis, Kristof
;
Wouters, Lennaert
;
Hantschel, Thomas
;
Decoutere, Stefaan
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2114
since deposited on 2021-10-31
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Acq. date: 2025-12-13
Citations
Metrics
Views
2114
since deposited on 2021-10-31
8
last month
8
last week
Acq. date: 2025-12-13
Citations