dc.contributor.author | Nuytten, Thomas | |
dc.contributor.author | Bogdanowicz, Janusz | |
dc.contributor.author | Gawlik, Andrzej | |
dc.contributor.author | Oniki, Yusuke | |
dc.contributor.author | Kenis, Karine | |
dc.contributor.author | Muraki, Yusuke | |
dc.contributor.author | Charley, Anne-Laure | |
dc.contributor.author | Fleischmann, Claudia | |
dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | van der Heide, Paul | |
dc.date.accessioned | 2021-10-31T10:11:44Z | |
dc.date.available | 2021-10-31T10:11:44Z | |
dc.date.issued | 2021 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37024 | |
dc.source | IIOimport | |
dc.title | Enhanced light coupling into nanostructured arrays as an enabler for advanced Raman-based metrology | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Nuytten, Thomas | |
dc.contributor.imecauthor | Bogdanowicz, Janusz | |
dc.contributor.imecauthor | Gawlik, Andrzej | |
dc.contributor.imecauthor | Oniki, Yusuke | |
dc.contributor.imecauthor | Kenis, Karine | |
dc.contributor.imecauthor | Muraki, Yusuke | |
dc.contributor.imecauthor | Charley, Anne-Laure | |
dc.contributor.imecauthor | Fleischmann, Claudia | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.imecauthor | van der Heide, Paul | |
dc.contributor.orcidimec | Nuytten, Thomas::0000-0002-5921-6928 | |
dc.contributor.orcidimec | Bogdanowicz, Janusz::0000-0002-7503-8922 | |
dc.contributor.orcidimec | Gawlik, Andrzej::0000-0002-6540-2735 | |
dc.contributor.orcidimec | Oniki, Yusuke::0000-0002-6619-1327 | |
dc.contributor.orcidimec | Fleischmann, Claudia::0000-0003-1531-6916 | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.contributor.orcidimec | van der Heide, Paul::0000-0001-6292-0329 | |
dc.source.peerreview | yes | |
dc.source.conference | META 2021: 11th International Conference on Metamaterials, Photonic Crystals and Plasmonics | |
dc.source.conferencedate | 20/07/2021 | |
dc.source.conferencelocation | online online | |
imec.availability | Published - imec | |