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A fast and simple methodology for lifetime prediction of ultra-thin oxides

dc.contributor.authorNigam, Tanya
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-14T11:31:46Z
dc.date.available2021-10-14T11:31:46Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3703
dc.sourceIIOimport
dc.titleA fast and simple methodology for lifetime prediction of ultra-thin oxides
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.beginpage381
dc.source.endpage388
dc.source.conferenceProceedings of the International Reliability Physics Symposium; March 1999; San Diego, Ca, USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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