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Degradation of clean Si-surfaces due to storage in clean (?) wafer boxes
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Authors
Storm, Wolfgang
;
Vandervorst, Wilfried
;
Alay, Josep Lluis
;
Meuris, Marc
;
Opdebeeck, Ann
;
Heyns, Marc
;
Polleunis, C.
;
Bertrand, P.
Conference
Proceedings of the 2nd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
Title
Degradation of clean Si-surfaces due to storage in clean (?) wafer boxes
Publication type
Proceedings paper
Embargo date
9999-12-31
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