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Gate module study for performance improvement in vertical GaN device

dc.contributor.authorRuzzarin, Maria
dc.contributor.authorGeens, Karen
dc.contributor.authorBorga, Matteo
dc.contributor.authorLiang, Hu
dc.contributor.authorYou, Shuzhen
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorDe Santi, Carlo
dc.contributor.authorMeneghini, Matteo
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorZanoni, Enrico
dc.date.accessioned2021-10-31T10:49:29Z
dc.date.available2021-10-31T10:49:29Z
dc.date.issued2021
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37122
dc.sourceIIOimport
dc.titleGate module study for performance improvement in vertical GaN device
dc.typeProceedings paper
dc.contributor.imecauthorRuzzarin, Maria
dc.contributor.imecauthorGeens, Karen
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorLiang, Hu
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecGeens, Karen::0000-0003-1815-3972
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage70
dc.source.endpage71
dc.source.conferenceWOCSDICE 2021 - 44th Workshop on Copound Semiconductor Devices and Integrated Circuits held in Europe
dc.source.conferencedate14/06/2020
dc.source.conferencelocationVirtual conference online England
imec.availabilityPublished - imec


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