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dc.contributor.authorSimoen, Eddy
dc.contributor.authorVeloso, Anabela
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorTakakura, Kenichiro
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-31T11:15:46Z
dc.date.available2021-10-31T11:15:46Z
dc.date.issued2021
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37185
dc.sourceIIOimport
dc.titleFrontiers in low-frequency noise research in advanced semiconductor devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorTakakura, Kenichiro
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceChina Semiconductor Technology Integration Conference CSTIC 21
dc.source.conferencedate17/03/2021
dc.source.conferencelocationPiscataway USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9461526
imec.availabilityPublished - imec


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