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Photoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers

dc.contributor.authorO'Donnell, K. P.
dc.contributor.authorWhite, M. E.
dc.contributor.authorPereira, S.
dc.contributor.authorWu, Ming Fang
dc.contributor.authorVantomme, Andre
dc.contributor.authorVan der Stricht, Wim
dc.contributor.authorJacobs, Koen
dc.contributor.authorMartin, R. W.
dc.date.accessioned2021-10-14T11:32:25Z
dc.date.available2021-10-14T11:32:25Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3718
dc.sourceIIOimport
dc.titlePhotoluminescence mapping and Rutherford backscattering spectrometry of InGaN epilayers
dc.typeOral presentation
dc.contributor.imecauthorVantomme, Andre
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conference1st UK Nitrides Consortium Conference
dc.source.conferencedate24/09/1999
dc.source.conferencelocationGlasgow UK
imec.availabilityPublished - open access


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