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Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides
dc.contributor.author | Celano, U. | |
dc.contributor.author | Lee, Y. | |
dc.contributor.author | Serron, J. | |
dc.contributor.author | Smith, C. | |
dc.contributor.author | Franco, J. | |
dc.contributor.author | Ryu, K. | |
dc.contributor.author | Kim, M. | |
dc.contributor.author | Park, S. | |
dc.contributor.author | Lee, J. | |
dc.contributor.author | Kim, J. | |
dc.contributor.author | van der Heide, P. | |
dc.date.accessioned | 2021-11-02T15:54:52Z | |
dc.date.available | 2021-11-02T15:54:52Z | |
dc.date.issued | 2021-NOV | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.other | WOS:000709200800014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37420 | |
dc.source | WOS | |
dc.title | Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides | |
dc.type | Journal article | |
dc.contributor.imecauthor | Celano, U. | |
dc.contributor.imecauthor | Serron, J. | |
dc.contributor.imecauthor | Smith, C. | |
dc.contributor.imecauthor | Franco, J. | |
dc.contributor.imecauthor | van der Heide, P. | |
dc.identifier.doi | 10.1016/j.sse.2021.108136 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.journal | SOLID-STATE ELECTRONICS | |
dc.source.volume | 185 | |
imec.availability | Under review |
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