dc.contributor.author | Grasser, T. | |
dc.contributor.author | O'Sullivan, Barry | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Stampfer, B. | |
dc.contributor.author | Waltl, M. | |
dc.date.accessioned | 2021-12-07T08:16:08Z | |
dc.date.available | 2021-11-02T15:58:32Z | |
dc.date.available | 2021-12-07T08:16:08Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000672563100093 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37691.2 | |
dc.source | WOS | |
dc.title | CV Stretch-Out Correction after Bias Temperature Stress: Work-function Dependence of Donor-/Acceptor-like Traps, Fixed Charges, and Fast States | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | O'Sullivan, Barry | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.identifier.doi | 10.1109/IRPS46558.2021.9405184 | |
dc.identifier.eisbn | 978-1-7281-6893-7 | |
dc.source.numberofpages | 6 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 21-24, 2021 | |
dc.source.conferencelocation | Monterey, CA, USA | |
dc.source.journal | na | |
imec.availability | Published - imec | |