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Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
dc.contributor.author | Chang, Hao | |
dc.contributor.author | Zhou, Longda | |
dc.contributor.author | Yang, Hong | |
dc.contributor.author | Ji, Zhigang | |
dc.contributor.author | Liu, Qianqian | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Yin, Huaxiang | |
dc.contributor.author | Wang, Wenwu | |
dc.date.accessioned | 2021-11-02T15:58:34Z | |
dc.date.available | 2021-11-02T15:58:34Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000672563100073 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37694 | |
dc.source | WOS | |
dc.title | Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.identifier.doi | 10.1109/IRPS46558.2021.9405162 | |
dc.identifier.eisbn | 978-1-7281-6893-7 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 21-24, 2021 | |
imec.availability | Under review |
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