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Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
Publication:
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
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Date
2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405162
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chang, Hao
;
Zhou, Longda
;
Yang, Hong
;
Ji, Zhigang
;
Liu, Qianqian
;
Simoen, Eddy
;
Yin, Huaxiang
;
Wang, Wenwu
Journal
na
Abstract
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1644
since deposited on 2021-11-02
2
last month
Acq. date: 2026-01-12
Citations
Metrics
Views
1644
since deposited on 2021-11-02
2
last month
Acq. date: 2026-01-12
Citations