Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
Publication:
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
Date
2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405162
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chang, Hao
;
Zhou, Longda
;
Yang, Hong
;
Ji, Zhigang
;
Liu, Qianqian
;
Simoen, Eddy
;
Yin, Huaxiang
;
Wang, Wenwu
Journal
na
Abstract
Description
Metrics
Views
1634
since deposited on 2021-11-02
Acq. date: 2025-10-24
Citations
Metrics
Views
1634
since deposited on 2021-11-02
Acq. date: 2025-10-24
Citations