dc.contributor.author | Zhou, Longda | |
dc.contributor.author | Zhang, Zhaohao | |
dc.contributor.author | Yang, Hong | |
dc.contributor.author | Ji, Zhigang | |
dc.contributor.author | Liu, Qianqian | |
dc.contributor.author | Zhang, Qingzhu | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Yin, Huaxiang | |
dc.contributor.author | Luo, Jun | |
dc.contributor.author | Du, Anyan | |
dc.contributor.author | Zhao, Chao | |
dc.contributor.author | Wang, Wenwu | |
dc.date.accessioned | 2022-02-07T10:59:45Z | |
dc.date.available | 2021-11-02T15:58:34Z | |
dc.date.available | 2022-02-07T10:59:45Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000672563100017 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37695.2 | |
dc.source | WOS | |
dc.title | A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.identifier.doi | 10.1109/IRPS46558.2021.9405105 | |
dc.identifier.eisbn | 978-1-7281-6893-7 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | MAR 21-24, 2021 | |
dc.source.conferencelocation | Virtual | |
dc.source.journal | na | |
imec.availability | Published - imec | |