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Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy

dc.contributor.authorRasras, Mahmoud
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorChen, Jian
dc.contributor.authorBock, Karlheinz
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-14T11:35:15Z
dc.date.available2021-10-14T11:35:15Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3771
dc.sourceIIOimport
dc.titleTemperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy
dc.typeProceedings paper
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage69
dc.source.endpage76
dc.source.conferenceConference Proceedings from the 25th International Symposium for Testing and Failure Analysis - ISTFA
dc.source.conferencedate14/11/1999
dc.source.conferencelocationSanta Clara, CA USA
imec.availabilityPublished - open access


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