dc.contributor.author | Rasras, Mahmoud | |
dc.contributor.author | De Wolf, Ingrid | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Chen, Jian | |
dc.contributor.author | Bock, Karlheinz | |
dc.contributor.author | Maes, Herman | |
dc.date.accessioned | 2021-10-14T11:35:15Z | |
dc.date.available | 2021-10-14T11:35:15Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3771 | |
dc.source | IIOimport | |
dc.title | Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 69 | |
dc.source.endpage | 76 | |
dc.source.conference | Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis - ISTFA | |
dc.source.conferencedate | 14/11/1999 | |
dc.source.conferencelocation | Santa Clara, CA USA | |
imec.availability | Published - open access | |