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Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxides

dc.contributor.authorRasras, Mahmoud
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorKaczer, Ben
dc.contributor.authorDegraeve, Robin
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-14T11:35:19Z
dc.date.available2021-10-14T11:35:19Z
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3772
dc.sourceIIOimport
dc.titlePhoto-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxides
dc.typeProceedings paper
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.beginpage465
dc.source.endpage468
dc.source.conferenceInternational Electron Devices Meeting. Technical digest; 5-8 Dec. 1999; Washington, D.C., USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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