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dc.contributor.authorSalahuddin, S.
dc.contributor.authorPerumkunnil, M.
dc.contributor.authorLitta, E. Dentoni
dc.contributor.authorGupta, A.
dc.contributor.authorWeckx, P.
dc.contributor.authorRyckaert, J.
dc.contributor.authorNa, M. H.
dc.contributor.authorSpessot, A.
dc.date.accessioned2021-11-02T15:59:09Z
dc.date.available2021-11-02T15:59:09Z
dc.date.issued2020
dc.identifier.issn0743-1562
dc.identifier.otherWOS:000668063000062
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37745
dc.sourceWOS
dc.titleBuried power SRAM DTCO and system-level benchmarking in N3
dc.typeProceedings paper
dc.contributor.imecauthorSalahuddin, S.
dc.contributor.imecauthorPerumkunnil, M.
dc.contributor.imecauthorLitta, E. Dentoni
dc.contributor.imecauthorGupta, A.
dc.contributor.imecauthorWeckx, P.
dc.contributor.imecauthorRyckaert, J.
dc.contributor.imecauthorNa, M. H.
dc.contributor.imecauthorSpessot, A.
dc.identifier.eisbn978-1-7281-6460-1
dc.source.numberofpages2
dc.source.peerreviewyes
dc.source.conferenceIEEE Symposium on VLSI Technology and Circuits
dc.source.conferencedateJUN 15-19, 2020
imec.availabilityUnder review


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