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Buried power SRAM DTCO and system-level benchmarking in N3
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Authors
Salahuddin, Shairfe Muhammad
;
Perumkunnil, Manu
;
Dentoni Litta, Eugenio
;
Gupta, Anshul
;
Weckx, Pieter
;
Ryckaert, Julien
;
Na, Myung Hee
;
Spessot, Alessio
EISBN
978-1-7281-6460-1
ISSN
0743-1562
Conference
IEEE Symposium on VLSI Technology and Circuits
Journal
na
Title
Buried power SRAM DTCO and system-level benchmarking in N3
Publication type
Proceedings paper
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Date
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2
20.500.12860/37745.2
*
2021-12-14T09:30:41Z
validation by library/open access desk
1
20.500.12860/37745
2021-11-02T15:59:09Z
*Selected version
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