Browsing by author "Weckx, Pieter"
Now showing items 1-20 of 138
-
3D SRAM Macro Design in 3D Nanofabric Process Technology
Abdi, Dawit; Salahuddin, Shairfe Muhammad; Boemmels, Juergen; Giacomin, Edouard; Weckx, Pieter; Ryckaert, Julien; Hellings, Geert; Catthoor, Francky (2023) -
3D-optimized SRAM Macro Design and Application to Memory-on-Logic 3D-IC at Advanced Nodes
Chen, Rongmei; Weckx, Pieter; Salahuddin, Shairfe Muhammad; Kim, Soon-Wook; Sisto, Giuliano; Van der Plas, Geert; Stucchi, Michele; Baert, Rogier; Debacker, Peter; Na, Myung Hee; Ryckaert, Julien; Milojevic, Dragomir; Beyne, Eric (2020) -
A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
Kaczer, Ben; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Putcha, Vamsi; Bury, Erik; Simicic, Marko; Vaisman Chasin, Adrian; Linten, Dimitri; Parvais, Bertrand; Catthoor, Francky; Rzepa, Gerhard; Waltl, Michael; Grasser, Tibor (2018) -
A Comprehensive Study of Nanosheet and Forksheet SRAM for Beyond N5 Node
Gupta, Mohit; Weckx, Pieter; Schuddinck, Pieter; Jang, Doyoung; Chehab, Bilal; Cosemans, Stefan; Ryckaert, Julien; Dehaene, Wim (2021) -
A fully-integrated method for RTN parameter extraction
Simicic, Marko; Morrison, Sebastien; Parvais, Bertrand; Weckx, Pieter; Kaczer, Ben; Sawada, Ken; Ammo, Hiroaki; Yamakawa, Shinya; Nomoto, Kazuki; Ono, Makoto; Linten, Dimitri; Verkest, Diederik; Wambacq, Piet; Groeseneken, Guido; Gielen, Georges (2017) -
Accuracy of quasi-Monte Carlo technique in failure probability estimations
Noltsis, Michail; Weckx, Pieter; Rodopoulos, Dimitrios; Catthoor, Francky; Soudris, Dimitrios (2016) -
Analysis of advanced technology nodes and h-NA EUV introduction: a cost perspective
Mirabelli, Gioele; Wang, Jane; Trivkovic, Darko; Weckx, Pieter; Spessot, Alessio; Ronse, Kurt; Kim, Ryan Ryoung han; Hellings, Geert; Ryckaert, Julien (2021) -
Analysis of functional errors produced by long-term workload-dependent BTI degradation in ultralow power processors
Duch, Loris; Peon-Quiros, Miguel; Weckx, Pieter; Levisse, Alex; Braojos, Ruben; Catthoor, Francky; Atienza, David (2020) -
Assessing reliability of nano-scaled CMOS technologies one defect at a time
Kaczer, Ben; Grasser, Tibor; Franco, Jacopo; Toledano Luque, Maria; Weckx, Pieter; Roussel, Philippe; Groeseneken, Guido (2012) -
Atomistic pseudo-transient BTI simulation with inherent workload memory
Rodopoulos, D.; Weckx, Pieter; Noltsis, M.; Catthoor, Francky; Soudris, D. (2014) -
Backside power delivery as a scaling knob for future systems
Chava, Bharani; Shaik, Khaja Ahmad; Jourdain, Anne; Guissi, Sofiane; Weckx, Pieter; Ryckaert, Julien; Van der Plas, Geert; Spessot, Alessio; Beyne, Eric; Mocuta, Anda (2019) -
Benchmarking time-dependent variability of junctionless nanowire FETs
Kaczer, Ben; Rzepa, G.; Franco, Jacopo; Weckx, Pieter; Vaisman Chasin, Adrian; Putcha, Vamsi; Bury, Erik; Simicic, Marko; Roussel, Philippe; Hellings, Geert; Veloso, Anabela; Matagne, Philippe; Grasser, T.; Linten, Dimitri (2017) -
BTI analysis for high performance and low power SRAM sense amplifier designs
Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015) -
BTI reliability and time-dependent variability of stacked gate-all-around Si nanowire transistors
Vaisman Chasin, Adrian; Franco, Jacopo; Kaczer, Ben; Putcha, Vamsi; Weckx, Pieter; Ritzenthaler, Romain; Mertens, Hans; Horiguchi, Naoto; Linten, Dimitri; Rzepa, Gerhard (2017) -
BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Jang, Doyoung; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido (2014) -
Buried power SRAM DTCO and system-level benchmarking in N3
Salahuddin, Shairfe Muhammad; Perumkunnil, Manu; Dentoni Litta, Eugenio; Gupta, Anshul; Weckx, Pieter; Ryckaert, Julien; Na, Myung Hee; Spessot, Alessio (2020) -
Capturing true workload dependency of BTI-induced degradation in CPU components
Stamoulis, Dimitrios; Corbetta, Simone; Rodopoulos, Dimitrios; Weckx, Pieter; Debacker, Peter; Meyer H., Brett; Kaczer, Ben; Raghavan, Praveen; Soudris, Dimitrios; Catthoor, Francky; Zilic, Zeljko (2016) -
CFET SRAM DTCO, Interconnect Guideline, and Benchmark for CMOS Scaling
Liu, Hsiao-Hsuan; Salahuddin, Shairfe Muhammad; Chan, Boon Teik; Schuddinck, Pieter; Xiang, Yang; Hellings, Geert; Weckx, Pieter; Ryckaert, Julien; Catthoor, Francky (2023) -
CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark
Liu, Hsiao-Hsuan; Schuddinck, Pieter; Pei, Zhenlin; Verschueren, Lynn; Mertens, Hans; Salahuddin, Shairfe Muhammad; Hiblot, Gaspard; Xiang, Yang; Chan, Boon Teik; Subramanian, Sujith; Weckx, Pieter; Hellings, Geert; Garcia Bardon, Marie; Ryckaert, Julien; Pan, Chenyun; Catthoor, Francky (2023) -
Characterization and simulation methodology for time-dependent variability in advanced technologies
Weckx, Pieter; Kaczer, Ben; Raghavan, Praveen; Franco, Jacopo; Simicic, Marko; Roussel, Philippe; Linten, Dimitri; Thean, Aaron; Verkest, Diederik; Catthoor, Francky; Groeseneken, Guido (2015)