Publication:
BTI reliability and time-dependent variability of stacked gate-all-around Si nanowire transistors
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1993 since deposited on 2021-10-24
2last month
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Acq. date: 2026-04-06
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Statistics
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1993 since deposited on 2021-10-24
2last month
1last week
Acq. date: 2026-04-06
Citations