Publication:
BTI reliability and time-dependent variability of stacked gate-all-around Si nanowire transistors
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1997 since deposited on 2021-10-24
5last month
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Acq. date: 2026-05-02
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Statistics
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1997 since deposited on 2021-10-24
5last month
1last week
Acq. date: 2026-05-02
Citations