Publication:
BTI reliability and time-dependent variability of stacked gate-all-around Si nanowire transistors
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1988 since deposited on 2021-10-24
2last month
Acq. date: 2025-12-10
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Metrics
Views
1988 since deposited on 2021-10-24
2last month
Acq. date: 2025-12-10
Citations