A fully-integrated method for RTN parameter extraction

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Authors
Simicic, Marko; Morrison, Sebastien; Parvais, Bertrand; Weckx, Pieter; Kaczer, Ben; Sawada, Ken; Ammo, Hiroaki; Yamakawa, Shinya; Nomoto, Kazuki; Ono, Makoto; Linten, Dimitri; Verkest, Diederik; Wambacq, Piet; Groeseneken, Guido; Gielen, Georges
Conference
Symposium on VLSI Technology
Title
A fully-integrated method for RTN parameter extraction
Publication type
Proceedings paper
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