Publication:

A fully-integrated method for RTN parameter extraction

Date

2017
Proceedings Paper
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dc.contributor.authorSimicic, Marko
dc.contributor.authorMorrison, Sebastien
dc.contributor.authorParvais, Bertrand
dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorSawada, Ken
dc.contributor.authorAmmo, Hiroaki
dc.contributor.authorYamakawa, Shinya
dc.contributor.authorNomoto, Kazuki
dc.contributor.authorOno, Makoto
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVerkest, Diederik
dc.contributor.authorWambacq, Piet
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorGielen, Georges
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorMorrison, Sebastien
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorGielen, Georges
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-24T13:33:08Z
dc.date.available2021-10-24T13:33:08Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29437
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7998151/
dc.source.beginpage132
dc.source.conferenceSymposium on VLSI Technology
dc.source.conferencedate5/06/2017
dc.source.conferencelocationKyoto Japan
dc.source.endpage133
dc.title

A fully-integrated method for RTN parameter extraction

dc.typeProceedings paper
dspace.entity.typePublication
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