BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?

Publication:

2014

Proceedings Paper

Author(s)

Kukner, Halil

;

;

Raghavan, Praveen

;

;

;

;

Van der Perre, Liesbet

;

;

2020 since deposited on 2021-10-22

Acq. date: 2026-07-16