BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?

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Authors
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Jang, Doyoung; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido
Conference
Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale - MEDIAN
Title
BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?
Publication type
Proceedings paper
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