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BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?
Publication:
BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?
Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kukner, Halil
;
Weckx, Pieter
;
Raghavan, Praveen
;
Kaczer, Ben
;
Jang, Doyoung
;
Catthoor, Francky
;
Van der Perre, Liesbet
;
Lauwereins, Rudy
;
Groeseneken, Guido
Journal
Abstract
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2010
since deposited on 2021-10-22
Acq. date: 2025-10-29
Citations
Metrics
Views
2010
since deposited on 2021-10-22
Acq. date: 2025-10-29
Citations