Publication:

BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?

Date

2014
Proceedings Paper
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dc.contributor.authorKukner, Halil
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorKaczer, Ben
dc.contributor.authorJang, Doyoung
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVan der Perre, Liesbet
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.accessioned2021-10-22T02:43:38Z
dc.date.available2021-10-22T02:43:38Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24077
dc.source.conferenceWorkshop on Manufacturable and Dependable Multicore Architectures at Nanoscale - MEDIAN
dc.source.conferencedate28/03/2014
dc.source.conferencelocationDresden Germany
dc.title

BTI reliability from planar to FinFET nodes: Will the next node be more or less reliable?

dc.typeProceedings paper
dspace.entity.typePublication
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