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dc.contributor.authorPerra, Cristian
dc.contributor.authorFreitas, Pedro Garcia
dc.contributor.authorSeidel, Ismael
dc.contributor.authorSchelkens, Peter
dc.date.accessioned2022-02-10T10:37:02Z
dc.date.available2021-11-02T15:59:51Z
dc.date.available2022-02-10T10:37:02Z
dc.date.issued2021
dc.identifier.issn0277-786X
dc.identifier.otherWOS:000671891800026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37787.2
dc.sourceWOS
dc.titleAn overview of the emerging JPEG Pleno standard, conformance testing and reference software
dc.typeProceedings paper
dc.contributor.imecauthorSchelkens, Peter
dc.contributor.orcidextFreitas, Pedro Garcia::0000-0003-0866-658X
dc.contributor.orcidimecSchelkens, Peter::0000-0003-0908-1655
dc.identifier.doi10.1117/12.2555841
dc.identifier.eisbn978-1-5106-3479-4
dc.source.numberofpages13
dc.source.peerreviewyes
dc.source.beginpage113530Y
dc.source.conferenceConference on Optics, Photonics and Digital Technologies for Imaging Applications VI
dc.source.conferencedateAPR 06-10, 2020
dc.source.conferencelocationVirtual
dc.source.journalProceedings of SPIE
dc.source.volume11353
imec.availabilityPublished - imec


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