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DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates

dc.contributor.authorYadav, Sachin
dc.contributor.authorVais, Abhitosh
dc.contributor.authorElKashlan, Rana Y.
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorVondkar Kodandarama, Komal
dc.contributor.authorMols, Yves
dc.contributor.authorWalke, Amey
dc.contributor.authorYu, Hao
dc.contributor.authorAlcotte, Reynald
dc.contributor.authorIngels, Mark
dc.contributor.authorWambacq, Piet
dc.contributor.authorLanger, Robert
dc.contributor.authorKunert, Bernardette
dc.contributor.authorWaldron, Niamh
dc.contributor.authorParvais, Bertrand
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2022-01-28T10:29:20Z
dc.date.available2021-11-02T16:01:24Z
dc.date.available2022-01-28T10:29:20Z
dc.date.issued2021
dc.identifier.issnna
dc.identifier.otherWOS:000654861200023
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37896.2
dc.sourceWOS
dc.titleDC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates
dc.typeProceedings paper
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorVais, Abhitosh
dc.contributor.imecauthorElKashlan, Rana Y.
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorVondkar Kodandarama, Komal
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorWalke, Amey
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorAlcotte, Reynald
dc.contributor.imecauthorIngels, Mark
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorLanger, Robert
dc.contributor.imecauthorKunert, Bernardette
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecElKashlan, R. Y.::0000-0003-0576-4344
dc.contributor.orcidimecParvais, B.::0000-0003-0769-7069
dc.contributor.orcidimecVais, Abhitosh::0000-0002-0317-7720
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecIngels, Mark::0000-0003-1939-2422
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecLanger, Robert::0000-0002-1132-3468
dc.contributor.orcidimecKunert, Bernardette::0000-0002-8986-4109
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecYadav, Sachin::0000-0003-4530-2603
dc.contributor.orcidimecElKashlan, Rana Y.::0000-0003-0576-4344
dc.contributor.orcidimecMols, Yves::0000-0002-7072-0113
dc.identifier.eisbn978-2-87487-060-6
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage89
dc.source.endpage92
dc.source.conference15th European Microwave Integrated Circuits Conference (EuMIC) / 50th European Microwave Conference (EuMC)
dc.source.conferencedateJAN 10-15, 2021
dc.source.conferencelocationVirtual
dc.source.journalna
imec.availabilityPublished - imec


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220.500.12860/37896.2*2022-01-28T10:20:50Zvalidation by library/open access desk
120.500.12860/378962021-11-02T16:01:24Z

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