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DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates
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Authors
Yadav, Sachin
;
Vais, Abhitosh
;
ElKashlan, Rana Y.
;
Witters, Liesbeth
;
Vondkar Kodandarama, Komal
;
Mols, Yves
;
Walke, Amey
;
Yu, Hao
;
Alcotte, Reynald
;
Ingels, Mark
;
Wambacq, Piet
;
Langer, Robert
;
Kunert, Bernardette
;
Waldron, Niamh
;
Parvais, Bertrand
;
Collaert, Nadine
EISBN
978-2-87487-060-6
ISSN
na
Conference
15th European Microwave Integrated Circuits Conference (EuMIC) / 50th European Microwave Conference (EuMC)
Journal
na
Title
DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates
Publication type
Proceedings paper
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Conference contributions
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Version
Item
Date
Summary
2
20.500.12860/37896.2
*
2022-01-28T10:20:50Z
validation by library/open access desk
1
20.500.12860/37896
2021-11-02T16:01:24Z
*Selected version
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