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DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates

dc.contributor.authorYadav, S.
dc.contributor.authorVais, A.
dc.contributor.authorElKashlan, R. Y.
dc.contributor.authorWitters, L.
dc.contributor.authorVondkar, K.
dc.contributor.authorMols, Y.
dc.contributor.authorWalke, A.
dc.contributor.authorYu, H.
dc.contributor.authorAlcotte, R.
dc.contributor.authorIngels, M.
dc.contributor.authorWambacq, P.
dc.contributor.authorLanger, R.
dc.contributor.authorKunert, B.
dc.contributor.authorWaldron, N.
dc.contributor.authorParvais, B.
dc.contributor.authorCollaert, N.
dc.date.accessioned2021-11-02T16:01:24Z
dc.date.available2021-11-02T16:01:24Z
dc.date.issued2021
dc.identifier.otherWOS:000654861200023
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37896
dc.sourceWOS
dc.titleDC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates
dc.typeProceedings paper
dc.contributor.imecauthorYadav, S.
dc.contributor.imecauthorVais, A.
dc.contributor.imecauthorElKashlan, R. Y.
dc.contributor.imecauthorWitters, L.
dc.contributor.imecauthorVondkar, K.
dc.contributor.imecauthorMols, Y.
dc.contributor.imecauthorWalke, A.
dc.contributor.imecauthorYu, H.
dc.contributor.imecauthorAlcotte, R.
dc.contributor.imecauthorIngels, M.
dc.contributor.imecauthorWambacq, P.
dc.contributor.imecauthorLanger, R.
dc.contributor.imecauthorKunert, B.
dc.contributor.imecauthorWaldron, N.
dc.contributor.imecauthorParvais, B.
dc.contributor.imecauthorCollaert, N.
dc.contributor.orcidimecElKashlan, R. Y.::0000-0003-0576-4344
dc.contributor.orcidimecParvais, B.::0000-0003-0769-7069
dc.identifier.eisbn978-2-87487-060-6
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.beginpage89
dc.source.endpage92
dc.source.conference15th European Microwave Integrated Circuits Conference (EuMIC) / 50th European Microwave Conference (EuMC)
dc.source.conferencedateJAN 10-15, 2021
imec.availabilityUnder review


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VersionItemDateSummary
220.500.12860/37896.22022-01-28T10:20:50Zvalidation by library/open access desk
120.500.12860/37896*2021-11-02T16:01:24Z

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