dc.contributor.author | Wu, Lizhou | |
dc.contributor.author | Rao, Siddharth | |
dc.contributor.author | Taouil, Mottaqiallah | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Hamdioui, Said | |
dc.date.accessioned | 2022-01-06T15:48:31Z | |
dc.date.available | 2021-11-02T16:01:40Z | |
dc.date.available | 2022-01-06T15:48:31Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1089-3539 | |
dc.identifier.other | WOS:000652599400049 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37919.2 | |
dc.source | WOS | |
dc.title | Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Rao, Siddharth | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.orcidimec | Rao, Siddharth::0000-0001-6161-3052 | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.identifier.doi | 10.1109/ITC44778.2020.9325258 | |
dc.identifier.eisbn | 978-1-7281-9113-3 | |
dc.source.numberofpages | 10 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Test Conference (ITC) | |
dc.source.conferencedate | NOV 03-05, 2020 | |
dc.source.conferencelocation | Washington, DC, USA | |
dc.source.journal | na | |
imec.availability | Published - imec | |