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Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks
dc.contributor.author | Alves Pereira, Luis F. | |
dc.contributor.author | de Beenhouwer, Jan | |
dc.contributor.author | Kastner, Johann | |
dc.contributor.author | Sijbers, Jan | |
dc.date.accessioned | 2021-11-02T16:01:40Z | |
dc.date.available | 2021-11-02T16:01:40Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1082-3409 | |
dc.identifier.other | WOS:000649734800089 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37921 | |
dc.source | WOS | |
dc.title | Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | de Beenhouwer, Jan | |
dc.contributor.imecauthor | Sijbers, Jan | |
dc.contributor.orcidext | Kastner, Johann::0000-0002-3163-0916 | |
dc.contributor.orcidimec | De Beenhouwer, Jan::0000-0001-5253-1274 | |
dc.contributor.orcidimec | Sijbers, Jan::0000-0003-4225-2487 | |
dc.identifier.doi | 10.1109/ICTAI50040.2020.00099 | |
dc.identifier.eisbn | 978-1-7281-9228-4 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 612 | |
dc.source.endpage | 616 | |
dc.source.conference | 32nd IEEE International Conference on Tools with Artificial Intelligence (ICTAI) | |
dc.source.conferencedate | NOV 09-11, 2020 | |
imec.availability | Under review |
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