dc.contributor.author | Gao, Zhan | |
dc.contributor.author | Hu, Min-Chun | |
dc.contributor.author | Malagi, Santosh | |
dc.contributor.author | Swenton, Joe | |
dc.contributor.author | Huisken, Jos | |
dc.contributor.author | Goossens, Kees | |
dc.contributor.author | Marinissen, Erik Jan | |
dc.contributor.editor | Agrawal, Vishwani D. | |
dc.date.accessioned | 2022-06-24T07:58:49Z | |
dc.date.available | 2021-11-02T16:01:45Z | |
dc.date.available | 2022-05-19T10:34:12Z | |
dc.date.available | 2022-06-24T07:58:49Z | |
dc.date.issued | 2021-04-01 | |
dc.identifier.issn | 0923-8174 | |
dc.identifier.other | WOS:000654818500001 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/37933.3 | |
dc.source | WOS | |
dc.title | Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality | |
dc.type | Journal article | |
dc.contributor.imecauthor | Gao, Zhan | |
dc.contributor.imecauthor | Hu, Min-Chun | |
dc.contributor.imecauthor | Marinissen, Erik Jan | |
dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
dc.identifier.doi | 10.1007/s10836-021-05943-3 | |
dc.source.numberofpages | 29 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 161 | |
dc.source.endpage | 189 | |
dc.source.journal | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | |
dc.source.issue | 2 | |
dc.source.volume | 37 | |
imec.availability | Published - open access | |