Toggle navigation
My submissions
Login
Toggle navigation
View item
imec Publications Repository
imec Publications
Articles
View item
imec Publications Repository
imec Publications
Articles
View item
JavaScript is disabled for your browser. Some features of this site may not work without it.
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality
View/
open
Published version (7.487Mb)
Metadata
Show full item record
Authors
Gao, Zhan
;
Hu, Min-Chun
;
Malagi, Santosh
;
Swenton, Joe
;
Huisken, Jos
;
Goossens, Kees
;
Marinissen, Erik Jan
Editors
Agrawal, Vishwani D.
DOI
10.1007/s10836-021-05943-3
ISSN
0923-8174
Issue
2
Journal
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Volume
37
Title
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality
Publication type
Journal article
Collections
Articles
Version history
Version
Item
Date
Summary
3
20.500.12860/37933.3
*
2022-06-24T07:57:48Z
validation by library/open access desk
2
20.500.12860/37933.2
2022-05-19T10:23:37Z
validation by imec author
1
20.500.12860/37933
2021-11-02T16:01:45Z
*Selected version
Search imec Publications Repository
This collection
Browse
All of imec Publications Repository
Collections
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
This collection
Publication date
Authors
Titles
Subjects
imec author
Availability
Publication type
My account
login