Browsing by author "Hu, Min-Chun"
Now showing items 1-7 of 7
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Application of cell-aware test on an advanced 3nm CMOS standard-cell library
Gao, Zhan; Hu, Min-Chun; Marinissen, Erik Jan; Malagi, Santosh; Swenton, Joe; Huisken, Jos; Goossens, Kees (2019-05) -
Application of cell-aware test on an advanced 3nm CMOS technology library
Gao, Zhan; Hu, Min-Chun; Baert, Rogier; Chehab, Bilal; Malagi, Santosh; Swenton, Joe; Huisken, Jos; Goossens, Kees; Marinissen, Erik Jan (2019-11) -
Cell-Aware Test on Various Circuits in an Advanced 3-nm Technology
Gao, Zhan; Hu, Min-Chun; Baert, Rogier; Chehab, Bilal; Swenton, Joe; Malagi, Santosh; Huisken, Jos; Goossens, Kees; Marinissen, Erik Jan (2024) -
Optimizing cell-aware ATPG using defect detection matrices
Gao, Zhan; Hu, Min-Chun; Marinissen, Erik Jan; Swenton, Joe; Malagi, Santosh S.; Huisken, Jos; Goossens, Kees (2019-07) -
Optimizing of cell-aware ATPG results by manipulating library cells' defect detection matrices
Gao, Zhan; Hu, Min-Chun; Swenton, Joe; Malagi, Santosh S.; Huisken, Jos; Goossens, Kees; Marinissen, Erik Jan (2019-09) -
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality
Gao, Zhan; Hu, Min-Chun; Malagi, Santosh; Swenton, Joe; Huisken, Jos; Goossens, Kees; Marinissen, Erik Jan (2021-04-01) -
Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults
Hu, Min-Chun; Gao, Zhan; Malagi, Santosh; Swenton, Joe; Huisken, Jos; Goossens, Kees; Wu, Cheng-Wen; Marinissen, Erik Jan (2020)