Application of cell-aware test on an advanced 3nm CMOS technology library

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Authors
Gao, Zhan; Hu, Min-Chun; Baert, Rogier; Chehab, Bilal; Malagi, Santosh; Swenton, Joe; Huisken, Jos; Goossens, Kees; Marinissen, Erik Jan
Conference
IEEE International Test Conference (ITC'19)
Title
Application of cell-aware test on an advanced 3nm CMOS technology library
Publication type
Proceedings paper
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