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Application of cell-aware test on an advanced 3nm CMOS technology library
Publication:
Application of cell-aware test on an advanced 3nm CMOS technology library
Date
2019-11
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gao, Zhan
;
Hu, Min-Chun
;
Baert, Rogier
;
Chehab, Bilal
;
Malagi, Santosh
;
Swenton, Joe
;
Huisken, Jos
;
Goossens, Kees
;
Marinissen, Erik Jan
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1893
since deposited on 2021-10-27
Acq. date: 2025-10-24
Citations
Metrics
Views
1893
since deposited on 2021-10-27
Acq. date: 2025-10-24
Citations