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Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults
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Authors
Hu, Min-Chun
;
Gao, Zhan
;
Malagi, Santosh
;
Swenton, Joe
;
Huisken, Jos
;
Goossens, Kees
;
Wu, Cheng-Wen
;
Marinissen, Erik Jan
EISBN
978-1-7281-4312-5
ISSN
1530-1877
Conference
25th IEEE European Test Symposium (ETS)
Journal
na
Title
Tightening the Mesh Size of the Cell-Aware ATPG Net for Catching All Detectable Weakest Faults
Publication type
Proceedings paper
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2
20.500.12860/38222.2
*
2022-01-27T11:38:23Z
validation by library/open access desk
1
20.500.12860/38222
2021-11-02T16:05:40Z
*Selected version
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